SPECK SENSORSYSTEME GmbH | オプトロニクス社　オンライン展示会

SPECK SENSORSYSTEME GmbH

出展のみどころ

LID - Measurement of minimal absorptions of optical materials and optical coatings with the highest precision, down to 1 ppm.
CRD - reflectivity measurements for HR mirrors of 99.9998%. Extremely fast measurements in the GHz range of the smallest analog signals with high amplification. Low fluorescent signals also.
CRD reflectiviy measurement setup

Cavity-Ringdown system for precise evaluation of losses at high-reflective coating of optical components. Losses at plane or slightly concave |r|>>500mm HR-mirror with nominal reflectivities R>>99%
LID absolute absorption measurement setup

measurement system ultra-low absorption levels in bulk material and coatings: ultra low absorption levels in bulk material and coatings. Applicable for optical glasses), optical crystals, synthetics

出展のみどころ

LID - Measurement of minimal absorptions of optical materials and optical coatings with the highest precision, down to 1 ppm.
CRD - reflectivity measurements for HR mirrors of 99.9998%. Extremely fast measurements in the GHz range of the smallest analog signals with high amplification. Low fluorescent signals also.
CRD reflectiviy measurement setup

Cavity-Ringdown system for precise evaluation of losses at high-reflective coating of optical components. Losses at plane or slightly concave |r|>>500mm HR-mirror with nominal reflectivities R>>99%
LID absolute absorption measurement setup

measurement system ultra-low absorption levels in bulk material and coatings: ultra low absorption levels in bulk material and coatings. Applicable for optical glasses), optical crystals, synthetics

SPECK SENSORSYSTEME GmbH