CRD reflectiviy measurement setup

Cavity-Ringdown measurement systeme for precise evaluation of losses at high-reflective coating of optical components: * Reflectivity is obtained by evalution of losses L with the assumption of R=1-L *Mesurement of losses at plane or slightly concave |r|>>500mm HR-mirror with nominal reflectivities R>>99% (typical 99.9995% * Measurement of losses at various, discret angles of incidence and s- / p-polarization *Employed laser wavelength(s) selectable on order by user according to the desired target wavelength of coating (e.g 355nm to 1310nm)

LID absolute absorption measurement setup

measurement system for evaluation of ultra low absorption levels in bulk material and coatings: · ultra low absorption levels in bulk material and coatings · Applicable for optical glasses (SiO2, BK7, …), optical crystals (CaF2, YVO4, LiNbO3, …), transparent synthetics (polyacrylates, etc) · Features absolute electrical power calibration, not relying on models or assumptions about the material · Features absolute electrical power calibration, not relying on models or assumptions about the material · determination of the absolute absorption coefficient α ([cm-1] for bulk material) · Sensitivity < 10μW/cm NEP(SiO2) α < 1ppm/cm

CRD reflectiviy measurement setup

Cavity-Ringdown measurement systeme for precise evaluation of losses at high-reflective coating of optical components: * Reflectivity is obtained by evalution of losses L with the assumption of R=1-L *Mesurement of losses at plane or slightly concave |r|>>500mm HR-mirror with nominal reflectivities R>>99% (typical 99.9995% * Measurement of losses at various, discret angles of incidence and s- / p-polarization *Employed laser wavelength(s) selectable on order by user according to the desired target wavelength of coating (e.g 355nm to 1310nm)

LID absolute absorption measurement setup

measurement system for evaluation of ultra low absorption levels in bulk material and coatings: · ultra low absorption levels in bulk material and coatings · Applicable for optical glasses (SiO2, BK7, …), optical crystals (CaF2, YVO4, LiNbO3, …), transparent synthetics (polyacrylates, etc) · Features absolute electrical power calibration, not relying on models or assumptions about the material · Features absolute electrical power calibration, not relying on models or assumptions about the material · determination of the absolute absorption coefficient α ([cm-1] for bulk material) · Sensitivity < 10μW/cm NEP(SiO2) α < 1ppm/cm